UV, visible, near-IR spectrophotometer, 顕微紫外可視近赤外分光
A new tool (Place: 3rd floor BASE building)
MSV-370 type microscope attached to ultraviolet-visible-near infrared spectrophotometer.
>> jascoinc.com/products/semiconductor/MSV-350-370UV-Vis-NIR.aspx
A microspectroscopy system providing transmittance or reflectance measurements of microscopic sample sites for a wide range of wavelengths (Continuous measurements between 250 and 2,000 nm). ** Conventional measurements require samples with dimensions comparable to an mm sized optical beam. This device can measure color, film thickness, and other spectral properties of a microscopic area for either large or small samples.
= First/previous administrator: Prof. T. Nakato (from Oct. 2011 with Kyushu Inst. Tech.)
顕微紫外可視近赤外分光光度計 MSV-370
>> jasco.co.jp/jpn/product/microUV/microUV.html
>> Other facilities around us: LIST >> empatlab.wordpress.com/top-page/facilities/
Posted on 2011, in Facilities and tagged Facility, Measurement, Optical. Bookmark the permalink. Leave a Comment.






